by Benoit Baudry, Yves Le Traon, Jean-Marc Jézéquel, Hanh Vu Le
Reference:
Trustable Components: Yet Another Mutation-Based Approach (Benoit Baudry, Yves Le Traon, Jean-Marc Jézéquel, Hanh Vu Le), In Proc. of the Symposium on Mutation Testing, 2000.
Bibtex Entry:
@inproceedings{Baudry00c, Address = {San Jose, CA}, keywords = {test, OOP, search-based}, Author = {Baudry, Benoit and {Le~Traon}, Yves and J{'e}z{'e}quel, Jean-Marc and Vu Le, Hanh}, Booktitle = {Proc. of the Symposium on Mutation Testing}, Month = oct, Pages = {69-76}, Title = {Trustable Components: Yet Another Mutation-Based Approach}, url = {http://www.irisa.fr/triskell/publis/2000/Baudry00c.pdf}, x-abbrv = {Mutation}, X-International-Audience = {yes}, X-Proceedings = {yes}, Year = {2000}, X-Language = {EN}, }