by Benoit Baudry, Yves Le Traon, Jean-Marc Jézéquel, Hanh Vu Le
Reference:
Trustable Components: Yet Another Mutation-Based Approach (Benoit Baudry, Yves Le Traon, Jean-Marc Jézéquel, Hanh Vu Le), In Proc. of the Symposium on Mutation Testing, 2000.
Bibtex Entry:
@inproceedings{Baudry00c,
Address = {San Jose, CA},
keywords = {test, OOP, search-based},
Author = {Baudry, Benoit and {Le~Traon}, Yves and J{'e}z{'e}quel, Jean-Marc and Vu Le, Hanh},
Booktitle = {Proc. of the Symposium on Mutation Testing},
Month = oct,
Pages = {69-76},
Title = {Trustable Components: Yet Another Mutation-Based Approach},
url = {http://www.irisa.fr/triskell/publis/2000/Baudry00c.pdf},
x-abbrv = {Mutation},
X-International-Audience = {yes},
X-Proceedings = {yes},
Year = {2000},
X-Language = {EN},
}