PACOGEN : Automatic Generation of Pairwise Test Configurations from Feature Models

by Aymeric Hervieu, Benoit Baudry, Arnaud Gotlieb
Reference:
PACOGEN : Automatic Generation of Pairwise Test Configurations from Feature Models (Aymeric Hervieu, Benoit Baudry, Arnaud Gotlieb), In Proc. of the Int. Symp. on Software Reliability Engineering (ISSRE), 2011.
Bibtex Entry:
@inproceedings{Hervieu11,
	keywords = {SPL, test},
	Author = {Hervieu, Aymeric and Baudry, Benoit and Gotlieb, Arnaud},
	Booktitle = {Proc. of the Int. Symp. on Software Reliability Engineering (ISSRE)},
	pages = {120-129},
	Title = {PACOGEN : Automatic Generation of Pairwise Test Configurations from Feature Models},
	X-International-Audience = {yes},
	X-Language = {EN},
	X-Proceedings = {yes},
	x-abbrv = {ISSRE},
	pages = {120 - 129},
	Year = {2011},
	url={https://hal.inria.fr/hal-00699558/document}}