Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines

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by Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon
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Reference:
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines (Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon), In Proc. of the Int. Conf. on Software Testing, Validation and Verification (ICST), 2010.
Bibtex Entry:
@inproceedings{Perrouin010a,
	keywords = {test, SPL, selected},
	Author = {{P}errouin, {G}illes and {S}en, {S}agar and {K}lein, {J}acques and {B}audry, {B}enoit and {L}e {T}raon, {Y}ves},
	Booktitle = {Proc. of the Int. Conf. on Software Testing, Validation and Verification (ICST)},
    pages = {459-468},
	Title = {Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines},
	Url = {http://www.irisa.fr/triskell/publis/2010/Perrouin010a.pdf},
	doi       = {10.1109/ICST.2010.43},
	X-Country = {FR},
	X-International-Audience = {yes},
	X-Language = {EN},
	X-Proceedings = {yes},
	Year = {2010},
	x-abbrv = {ICST},
}