by Gilles Perrouin, Sebastian Oster, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon
Reference:
Pairwise Testing for Software Product Lines: A Comparison of Two Approaches (Gilles Perrouin, Sebastian Oster, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon), In Software Quality Journal, Springer, volume 20, 2012.
Bibtex Entry:
@article{Perrouin2012,
keywords = {SPL, test},
Author = {Perrouin, Gilles and Oster, Sebastian and Sen, Sagar and Klein, Jacques and Baudry, Benoit and Le Traon, Yves},
Journal = {Software Quality Journal},
Pages = {605-643},
Publisher = {Springer},
Title = {Pairwise Testing for Software Product Lines: A Comparison of Two Approaches},
Volume = {20},
number = {3},
X-International-Audience = {yes},
X-Language = {EN},
url = {http://hal.inria.fr/docs/00/80/58/56/PDF/ICST-SPLC-SQJ2010-Ext.pdf},
x-abbrv = {SQJ},
Year = {2012}}
