by Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel
Reference:
Measuring and Improving Design Patterns Testability (Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel), In Proc. of the Metrics Symposium (Metrics), 2003.
Bibtex Entry:
@inproceedings{Baudry03a,
keywords = {test, OOP, metrics},
Author = {Baudry, Benoit and {Le~Traon}, Yves and Suny{'e}, Gerson and J{'e}z{'e}quel, Jean-Marc},
Booktitle = {Proc. of the Metrics Symposium (Metrics)},
pages={50-59},
Title = {Measuring and Improving Design Patterns Testability},
url = {http://www.irisa.fr/triskell/publis/2003/Baudry03a.pdf},
x-abbrv = {METRICS},
X-International-Audience = {yes},
X-Proceedings = {yes},
X-Language = {EN},
Year = {2003}}
