Mutation analysis for security tests qualification

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by Tejeddine Mouelhi, Yves Le Traon, Benoit Baudry
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Reference:
Mutation analysis for security tests qualification (Tejeddine Mouelhi, Yves Le Traon, Benoit Baudry), In Proc. of the workshop on mutation analysis at TAIC-Part 2007, 2007.
Bibtex Entry:
@inproceedings{mouelhi07a,
	keywords = {test, security},
	Author = {Mouelhi, Tejeddine and Le Traon, Yves and Baudry, Benoit},
	Booktitle = {Proc. of the workshop on mutation analysis at TAIC-Part 2007},
	pages={},
	Title = {Mutation analysis for security tests qualification},
	url = {http://www.irisa.fr/triskell/publis/2007/mouelhi07a.pdf},
	X-Country = {UK},
	X-International-Audience = {yes},
	X-Language = {EN},
	X-Proceedings = {yes},
	Year = {2007},
	x-abbrv = {Mutation},
	}